A Reliability-Enhanced Differential Sensing Amplifier for Hybrid CMOS/MTJ Logic Circuits

Recently, hybrid logic circuits based on magnetic tunnel junctions (MTJs) have been widely investigated to realize zero standby power. However, such CMOS/MTJ suffer from a severe sensing reliability due the limited magnetoresistance ratio (TMR ≤ 150%) of MTJ and large process variation in deep sub-micrometer technology node. In this paper, novel differential amplifier (DSA) is proposed, which two PMOS transistors are added connect discharging branches evaluation branches. Owing positive feedback realized by these transistors, it can achieve margin. By using an industrial CMOS 40 nm design kit physics-based compact model, simulations performed demonstrate its functionality evaluate performance. Simulation results show that smaller error rate 9% comparison with previously proposed DSAs TMR 100% 10%, while maintaining almost same delay 74.5 ps energy 1.92 fJ/bit.